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Atomic Force Microscope 0 04 Nm

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atomic force microscope 0 04 nm

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0.1 Hz - 30 Hz Atomic Force Microscope 0.04 nm High Precision Microscope With Multiple Modes

...nanoscale characterization. With a noise level in the Z direction of 0.04 nm, this microscope offers exceptional sensitivity and accuracy in capturing surface details. One of the key features of this product is its generous sample size capacity of 25 mm,...

Truth Instruments Co., Ltd.

Address: 169 Zhuzhou Road, Laoshan District, Qingdao, Shandong Province, China

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