using a compound light microscope

Model Number:NCM-V1000

Place of Origin:China

... opaque items for specialty applications such as measuring instruments for measuring thin films, electroplating coatings, grain size, surface inclusions and defects. They can also be used for metallic grain microstructure analysis and

Model Number:NCM-J8000

Place of Origin:China

... with reflected and transmitted light, which are used for a variety of specialty applications such as semiconductor silicon wafer manufacturing, inspection and quality control like inspection of grain size, surface ...

Model Number:NCM-M2100

Place of Origin:China

...h reflected and transmitted light, which are used for a variety of specialty applications such as semiconductor silicon wafer manufacturing, inspection and quality control like inspection of grain size, surface ...

Model Number:NCM-X3500

Place of Origin:China

...h reflected and transmitted light, which are used for a variety of specialty applications such as semiconductor silicon wafer manufacturing, inspection and quality control like inspection of grain size, surface ...

Model Number:NCM-M2000

Place of Origin:China

...h reflected and transmitted light, which are used for a variety of specialty applications such as semiconductor silicon wafer manufacturing, inspection and quality control like inspection of grain size, surface ...

Model Number:NCM-H6000

Place of Origin:China

...h reflected and transmitted light, which are used for a variety of specialty applications such as semiconductor silicon wafer manufacturing, inspection and quality control like inspection of grain size, surface ...

Model Number:NCM-TJ100

Place of Origin:China

...h reflected and transmitted light, which are used for a variety of specialty applications such as semiconductor silicon wafer manufacturing, inspection and quality control like inspection of grain size, surface ...

Model Number:NCM-M3000

Place of Origin:China

...h reflected and transmitted light, which are used for a variety of specialty applications such as semiconductor silicon wafer manufacturing, inspection and quality control like inspection of grain size, surface ...

Model Number:NCM-J8000

Place of Origin:China

...h reflected and transmitted light, which are used for a variety of specialty applications such as semiconductor silicon wafer manufacturing, inspection and quality control like inspection of grain size, surface ...

Model Number:NCM-M5000

Place of Origin:China

...h reflected and transmitted light, which are used for a variety of specialty applications such as semiconductor silicon wafer manufacturing, inspection and quality control like inspection of grain size, surface ...

Model Number:NCM-S1500

Place of Origin:China

...h reflected and transmitted light, which are used for a variety of specialty applications such as semiconductor silicon wafer manufacturing, inspection and quality control like inspection of grain size, surface ...

Model Number:NCM-J1200

Place of Origin:China

... And Metal Metallurgical Optical Microscope NCM-J 1200 Description Metallographic optical microscopes allow the user to view opaque items at high magnification with reflected and transmitted light, which are used for a variety of specialty applications...

Model Number:NCJ-1600

Place of Origin:China

... with reflected and transmitted light, which are used for a variety of specialty applications such as semiconductor silicon wafer manufacturing, inspection and quality control like inspection of grain size, surface ...

Model Number:NCM-M5000

Place of Origin:China

...Metallurgical Optical Microscope Wide Stage Optional DIC Observation NCM-M5000 Description Metallographic optical microscopes allow the user to view opaque items at high magnification with reflected and transmitted light, which are used for a variety of ...

Model Number:NCM-V1000

Place of Origin:China

...Microscope Trinocular NCM-V1000 Description Metallographic optical microscopes offer high magnification with reflected and transmitted light to allow the user to view opaque items for specialty applications such as measuring instruments for measuring thin films, electroplating coatings, grain size, surface inclusions and defects. They can also be used...

Model Number:NCJ-S800

Place of Origin:China

20X Reticle Eyepiece Crystal Jewelry Zoom Gem Stereo Microscope NCJ-S800 Halogen Description Gerry lvanov optical imaging systems and special jewelry tested microscope stand. Fully meet the appraisal needs of all kinds of diamonds, crystals, gems and other...

Model Number:NCJ-S800

Place of Origin:China

3D Effect Deep Depth of Field Zoom Gem Stereo Microscope NCJ-S800 Blood Stone Description Gerry lvanov optical imaging systems and special jewelry tested microscope stand. Fully meet the appraisal needs of all kinds of diamonds, crystals, gems and other ...

Model Number:NCJ-S800

Place of Origin:China

Transmit Reflected Illumination Gem Stereo Microscope NCJ-S800 Bright&Dark Field Description Gerry lvanov optical imaging systems and special jewelry tested microscope stand. Fully meet the appraisal needs of all kinds of diamonds, crystals, gems and other...

Brand Name:DHT

Model Number:HD130-8C

Place of Origin:China

...Microscope Camera With U - disk Storage And Overlay Graphics Product Description 1 can be used in printed circuit boards, flexible circuit boards, all kinds of components of plastic defects, electroplating quality appearance detection 2 Resolution for options :1024*768, 1280*768, 1920*1080, 1280*1024 @30fps or @60fps 3 camera directly connection to monitor through the VGA interface . Easy operation. 4 camera original strong light

Brand Name:VANCO

Model Number:VS7045-B9L

Place of Origin:CHINA

... and good depth within a broad field of view. Once brought in focus, images remains clear and sharp throughout the whole zoom range. It is widely used in electronic industry, educational demonstration and agricultural research for micro-object observation,